Test Slot Cooling System for a Storage Device Testing System

ABSTRACT

A test slot cooling system for a storage device testing system includes a storage device transporter having first and second portions. The first portion of the storage device transporter includes an air director and the second portion of the storage device transporter is configured to receive a storage device. The test slot cooling system includes a test slot housing defining an air entrance and a transporter opening for receiving the storage device transporter. The air entrance is in pneumatic communication with the air director of the received storage device transporter. The test slot cooling system also includes an air mover in pneumatic communication with the air entrance of the test slot housing for delivering air to the air director. The air director directs air substantially simultaneously over at least top and bottom surfaces of the storage device received in the storage device transporter.

TECHNICAL FIELD

This disclosure relates to test slot cooling systems for a storagedevice testing system.

BACKGROUND

Disk drive manufacturers typically test manufactured disk drives forcompliance with a collection of requirements. Test equipment andtechniques exist for testing large numbers of disk drives serially or inparallel. Manufacturers tend to test large numbers of disk drivessimultaneously in batches. Disk drive testing systems typically includeone or more racks having multiple test slots that receive disk drivesfor testing.

The testing environment immediately around the disk drive is closelyregulated. Minimum temperature fluctuations in the testing environmentare critical for accurate test conditions and for safety of the diskdrives. The latest generations of disk drives, which have highercapacities, faster rotational speeds and smaller head clearance, aremore sensitive to vibration. Excess vibration can affect the reliabilityof test results and the integrity of electrical connections. Under testconditions, the drives themselves can propagate vibrations throughsupporting structures or fixtures to adjacent units. This vibration“cross-talking,” together with external sources of vibration,contributes to bump errors, head slap and non-repetitive run-out (NRRO),which may result in lower test yields and increased manufacturing costs.

During the manufacture of disk drives or other storage devices, it iscommon to control the temperature of the storage devices, e.g., toensure that the storage devices are functional over a predeterminedtemperature range. For this reason, the testing environment immediatelyaround the storage devices is closely regulated. Minimum temperaturefluctuations in the testing environment can be critical for accuratetest conditions and for safety of the storage devices. In some knowntesting systems, the temperature of plural disk drive devices isadjusted by using cooling or heating air which is common to all of thedisk drive devices.

SUMMARY

One aspect of the disclosure a test slot cooling system for a storagedevice testing system includes a storage device transporter having firstand second portions. The first portion of the storage device transporterincludes an air director and the second portion of the storage devicetransporter is configured to receive a storage device. The test slotcooling system includes a test slot housing defining an air entrance anda transporter opening for receiving the storage device transporter. Theair entrance is in pneumatic communication with the air director of thereceived storage device transporter. The test slot cooling system alsoincludes an air mover in pneumatic communication with the air entranceof the test slot housing for delivering air to the air director. The airdirector directs air substantially simultaneously over at least top andbottom surfaces of the storage device received in the storage devicetransporter.

Implementations the disclosure may include one or more of the followingfeatures. In some implementations, the air director includes an airentrance and first and second air exits. The air director directs airreceived through its air entrance out the first and second air exits.The storage device has top, bottom, front, rear, right, and left sidesurfaces, and is received with its rear surface substantially facing thefirst portion of the storage device transporter. The first air exitdirects air over at least the bottom surface of the received storagedevice and the second air exit directs air over at least the top surfaceof the received storage device. In some implementations, the airdirector defines a cavity in pneumatic communication with the airentrance and air exits of the air director. The air director includes aplenum disposed in the cavity for directing at least a portion of theair received in the cavity out of the first air exit. In some examples,the plenum comprises a weight weighted to reduce movement of the storagedevice transporter in the test slot housing.

In some implementations, the second portion of the storage devicetransporter comprises first and second arms configured to receive astorage device. The second portion of the storage device transporter mayinclude a clamping system for releasably engaging a received storagedevice.

In some implementations, the test slot cooling system includes a coolingsystem housing disposed adjacent to the test slot housing. The coolingsystem housing has an air entrance in pneumatic communication with theair exit of the test slot housing and an air exit in pneumaticcommunication with the air entrance of the test slot housing. The airmover is disposed in the cooling system housing and circulates airreceived through the cooling system housing air entrance out of thecooling system housing air exit. The air moves along a closed loop paththrough the test slot housing and the cooling system housing. In someexamples, the air mover includes an air entrance and an air exit, whichis in pneumatic communication with the cooling system housing air exit.The air mover receives air along a first direction through its airentrance and delivers air out of its air exit along a second directionsubstantially perpendicular to the first direction. The air mover mayhave an air mover body having a width of about 45 mm, a length of about45 mm, and a height of about 10 mm. In some examples, the air mover isconfigured to produce an air flow rate of up to about 0.122 m3/min(4.308 CFM) and an air pressure of up to about 20.88 mmH2O (0.822inchH2O).

The test slot cooling system, in some implementations, includes an aircooler in pneumatic communication with the air mover. The air coolerincludes an air cooler body and at least one fin disposed on the aircooler body. The at least one fin cools air passing over it. The aircooler can be disposed in the cooling system housing upstream of the airmover, the air mover moving the air between the test slot housing andthe cooling system housing in a closed loop path

Another aspect of the disclosure is a test slot cooling system for astorage device testing system that includes a test slot housing definingan air entrance and a device opening for receiving a storage device. Thetest slot cooling system includes an air mover disposed exterior of thetest slot housing and in pneumatic communication with the air entranceof the test slot housing for delivering air to the received storagedevice. The air mover includes an air entrance and an air exit, which isin pneumatic communication with the air entrance of the test slothousing. The air mover receives air along a first direction through itsair entrance and delivering air out of its air exit along a seconddirection substantially perpendicular to the first direction.

Implementations the disclosure may include one or more of the followingfeatures. In some implementations, the slot cooling system includes acooling system housing disposed adjacent to the test slot housing. Thecooling system housing has an air entrance in pneumatic communicationwith an air exit of the test slot housing and an air exit in pneumaticcommunication with the air entrance of the test slot housing. The airmover is disposed in the cooling system housing and circulates airreceived through the cooling system housing air entrance out of thecooling system housing air exit. The air moves along a closed loop paththrough the test slot housing and the cooling system housing. In someexamples, the air mover includes an air mover body having a width ofabout 45 mm, a length of about 45 mm, and a height of about 10 mm. Thetest air mover may be configured to produce an air flow rate of up toabout 0.122 m3/min (4.308 CFM) and an air pressure of up to about 20.88mmH2O (0.822 inchH2O). In some examples, the test slot cooling systemincludes an air cooler in pneumatic communication with the air mover.The air cooler includes an air cooler body and at least one fin disposedon the air cooler body, where the at least one fin cools air passingover it.

Yet another aspect of the disclosure is a storage device transporter fora storage device testing system that includes a body having first andsecond portions. The first body portion includes an air director and thesecond body portion is configured to receive a storage device havingtop, bottom, front, rear, right, and left side surfaces. The storagedevice is received with its rear surface substantially facing the firstbody portion. The air director receives a flow of air and directs theair flow substantially simultaneously over at least the top and bottomsurfaces of the received storage device.

Implementations the disclosure may include one or more of the followingfeatures. In some implementations, the air director includes an airentrance and first and second air exits. The air director directs airreceived through the air entrance out the first and second air exits.The first air exit directs air over at least the bottom surface of thereceived storage device and the second air exit directs air over atleast the top surface of the received storage device. In some examples,the air director defines a cavity in pneumatic communication with theair entrance and air exits. The air director includes a plenum disposedin the cavity for directing at least a portion of the air received inthe cavity out of the first air exit. The plenum may be or include aweight weighted to reduce movement of the storage device transporterwhile received by the storage device testing system. In someimplementations, the second body portion of the storage devicetransporter includes a clamping system for releasably engaging areceived storage device.

Another aspect of the disclosure is a method of regulating thetemperature of a storage device received in a storage device testingsystem. The method includes delivering a flow of air into an airentrance of a test slot housing and directing the air flow substantiallysimultaneously over at least top and bottom surfaces of the storagedevice.

Implementations the disclosure may include one or more of the followingfeatures. In some implementations, the method includes delivering theair flow to an air director that directs the air flow over at least thetop and bottom surfaces of the storage device. The method may includesupporting the storage device in a storage device transporter receivedin the test slot housing. The storage device transporter has first andsecond portions. The first storage device transporter portion includesthe air director and the second storage device transporter portion isconfigured to receive the storage device. The storage device has top,bottom, front, rear, right, and left side surfaces and is received inthe storage device transporter with its rear surface substantiallyfacing the first body portion.

In some implementations, the method includes weighting the air directorto reduce movement of the storage device transporter while received bythe storage device testing system (e.g., while received in a test slotof the storage device testing system). The method may include deliveringthe air flow into an air entrance of the air director. The air directordirects the air received through the air entrance out first and secondair exits of the air director. The first air exit directs air over atleast the bottom surface of the received storage device and the secondair exit directs air over at least the top surface of the receivedstorage device. In some examples, the air director defines a cavity inpneumatic communication with the air entrance and air exits of the airdirector. The air director includes a plenum disposed in the cavity fordirecting at least a portion of the air received in the cavity out ofthe first air exit. The method may include weighting the plenum toreduce movement of the storage device transporter while received by thestorage device testing system.

In some implementations, the method includes directing the flow of airto an air mover in pneumatic communication with the air entrance of atest slot housing. The air mover delivers the flow of air into the airentrance of a test slot housing. The air flow moves along a closed looppath. The method may include receiving the flow of air into the airmover along a first direction and delivering the air flow to the airentrance of the test slot housing along a second direction substantiallyperpendicular to the first direction. In some examples, the methodincludes directing the flow of air over an air cooler disposed in theair flow path upstream of the air mover. In some implementations, themethod includes delivering the air flow into the air entrance of thetest slot housing at an air flow rate of up to about 0.122 m3/min (4.308CFM) and an air pressure of up to about 20.88 mmH2O (0.822 inchH2O).

The details of one or more implementations of the disclosure are setforth in the accompanying drawings and the description below. Otherfeatures, objects, and advantages will be apparent from the descriptionand drawings, and from the claims.

DESCRIPTION OF DRAWINGS

FIG. 1 is a perspective view of a storage device testing system havingracks arranged in a substantially circular configuration.

FIG. 2 is a top view of the storage device testing system shown in FIG.1.

FIG. 3 is a perspective view of a storage device testing system and atransfer station.

FIG. 4 is a perspective view of a storage device testing system havingracks arranged substantially in a row.

FIG. 5 is a top view of the storage device testing system shown in FIG.4.

FIGS. 6A and 6B are perspective views of a storage device transportercarrying a storage device being received inserted into a test slot of astorage device testing system.

FIG. 7 is a sectional view of a test slot along line 7-7 in FIG. 6A.

FIG. 8 is a side perspective view of a storage device transporter.

FIG. 9 is a front perspective view of a storage device transporter.

FIG. 10 is a bottom perspective view of a storage device transporter.

FIG. 11 is a perspective view of a storage device transporter receivinga storage device.

FIG. 12 is a perspective view of a test slot and a test slot coolingsystem in a rack of a storage device testing system.

FIG. 13 is a perspective view of an air cooler.

FIG. 14 is a perspective view of an air mover.

FIG. 15 is a top view of a test slot and a test slot cooling system in arack of a storage device testing system showing an air flow path throughthe test slot and a test slot cooling system.

FIG. 16 is a side sectional view of a test slot showing an air flow pathover the top and bottom surfaces of a storage device received in thetest slot.

Like reference symbols in the various drawings indicate like elements.

DETAILED DESCRIPTION

Temperature regulation of a storage device can be an important factorduring testing (e.g., validation, qualification, functional testing,etc.) of the storage device. One method of performing temperatureregulation includes moving air over and/or about the storage deviceduring testing. As will be discussed in detail, the volume, temperature,and flow path of the air moved with respect to the storage device duringtesting, inter alia, can each be factors in providing reliable,effective, and efficient temperature control of the storage device.

A storage device, as used herein, includes disk drives, solid statedrives, memory devices, and any device that requires asynchronoustesting for validation. A disk drive is generally a non-volatile storagedevice which stores digitally encoded data on rapidly rotating platterswith magnetic surfaces. A solid-state drive (SSD) is a data storagedevice that uses solid-state memory to store persistent data. An SSDusing SRAM or DRAM (instead of flash memory) is often called aRAM-drive. The term solid-state generally distinguishes solid-stateelectronics from electromechanical devices.

Referring to FIGS. 1-3, in some implementations, a storage devicetesting system 100 includes at least one automated transporter 200 (e.g.robotic arm, gantry system, or multi-axis linear actuator) defining afirst axis 205 (see FIG. 3) substantially normal to a floor surface 10.In the examples shown, the automated transporter 200 comprises a roboticarm 200 operable to rotate through a predetermined arc about the firstaxis 205 and to extend radially from the first axis 205. The robotic arm200 is operable to rotate 360° about the first axis 205 and includes amanipulator 210 disposed at a distal end 202 of the robotic arm 200 tohandle one or more storage devices 500 and/or storage devicetransporters 550 to carry the storage devices 500 (see e.g., FIGS. 5-6).Multiple racks 300 are arranged around the robotic arm 200 for servicingby the robotic arm 200. Each rack 300 houses multiple test slots 310configured to receive storage devices 500 for testing. The robotic arm200 defines a substantially cylindrical working envelope volume 220,with the racks 300 being arranged within the working envelope 220 foraccessibility of each test slot 310 for servicing by the robotic arm200. The substantially cylindrical working envelope volume 220 providesa compact footprint and is generally only limited in capacity by heightconstraints. In some examples, the robotic arm 200 is elevated by andsupported on a pedestal or lift 250 on the floor surface 10. Thepedestal or lift 250 increases the size of the working envelope volume220 by allowing the robotic arm 200 to reach not only upwardly, but alsodownwardly to service test slots 310. The size of the working envelopevolume 220 can be further increased by adding a vertical actuator to thepedestal or lift 250. A controller 400 (e.g., computing device)communicates with each automated transporter 200 and rack 300. Thecontroller 400 coordinates servicing of the test slots 310 by theautomated transporter(s) 200.

The robotic arm 200 is configured to independently service each testslot 310 to provide a continuous flow of storage devices 500 through thetesting system 100. A continuous flow of individual storage devices 500through the testing system 100 allows random start and stop times foreach storage device 500, whereas other systems that require batches ofstorage devices 500 to be run all at once as an entire testing loadedmust all have the same start and end times. Therefore, with continuousflow, storage devices 500 of different capacities can be run at the sametime and serviced (loaded/unloaded) as needed.

Referring to FIGS. 3-4, the storage device testing system 100 includes atransfer station 600 configured for bulk feeding of storage devices 500to the robotic arm 200. The robotic arm 200 independently services eachtest slot 310 by transferring a storage device 500 between the transferstation 600 and the test slot 310. The transfer station 600 houses oneor more totes 700 carrying multiple storage devices 500 presented forservicing by the robotic arm 200. The transfer station 600 is a servicepoint for delivering and retrieving storage devices 500 to and from thestorage device testing system 100. The totes 700 allow an operator todeliver and retrieve a collection of storage devices 500 to and from thetransfer station 600. In the example shown in FIG. 3, each tote 700 isaccessible from respective tote presentation support systems 620 in apresentation position and may be designated as a source tote 700 forsupplying a collection of storage devices 500 for testing or as adestination tote 700 for receiving tested storage devices 500 (or both).Destination totes 700 may be classified as “passed return totes” or“failed return totes” for receiving respective storage devices 500 thathave either passed or failed a functionality test, respectively.

Referring to FIGS. 4 and 5, in some implementations, the storage deviceprocessing system 100 includes at least one automated transporter 200(e.g., robotic arm, gantry system, or multi-axis linear actuator)disposed on a guide system 220. In the example shown, first and secondautomated transporters 200A, 200B, shown as robotic arms, are disposedon the guide system 230. Multiple racks 300 are arranged substantiallyin a row for servicing by the robotic arm(s) 200. Each rack 300 housesmultiple test slots 310 configured to receive storage devices 500 fortesting (e.g., diagnostic, connectivity, and/or performance testing). Acontroller 400 (e.g., computing device) communicates with each roboticarm 200 and rack 300. The controller 400 coordinates servicing of thetest slots 310 by the robotic arm(s) 200. For example, the controller400 can execute programs or instructions communicated to it or stored inmemory thereon for moving the robotic arms 200 along the guide system230. The controller 400 tracks the movements of the robotic arms 200 andprevents collisions.

In some implementations, the guide system 230 includes a linear actuatorconfigured to move an associated robotic arm 200 adjacently along theracks 300 to allow the associated robotic arm 200 to service test slots310 of more than one rack 300. In other implementations, each roboticarm 200 includes a drive system 240 configured to move the robotic arm200 along the guide system 230. For example, the robotic arm 200 may bemounted on a rail system 230 and the drive system 240 moves the roboticarm 200 along the rail system 230. The guide system 230 may be scalable(e.g., in length) and may accommodate multiple robotic arms 200, forexample, to support either longer racks 300 or to further reduce thearea serviced by each automated transporter 200 to increase throughputand/or accommodate shorter testing times. In the examples shown, therobotic arm 200 is operable to rotate through a predetermined arc abouta longitudinal axis 205 defined by the robotic arm 200 and to extendradially from the first axis 205. The robotic arm 200 is operable torotate 360° about the first axis 205 and includes a manipulator 210disposed at a distal end 202 of the robotic arm 200 to handle one ormore storage devices 500 and/or storage device transporters 550 thatcarry the storage devices 500 (see e.g. FIGS. 5-6). In some examples,the processing system 100 includes multiple guide systems 220 that eachsupport one or more robotic arms 200. The robotic arms 200 on each guidesystem 220 may be instructed to service adjacent racks 300 andassociated test slots 310.

In some implementations, the robotic arm 200 is configured toindependently service each test slot 310 to provide a continuous flow ofstorage devices 500 through the processing system 100. A continuous flowof individual storage devices 500 through the processing system 100allows random start and stop times for each storage device 500.Therefore, with continuous flow, storage devices 500 of differentcapacities can be run at the same time and serviced (e.g.,loaded/unloaded) as needed. In other implementations, the processingsystem 100 tests batches of storage devices 500 all at once, where anentire batch of loaded storage devices start and end at substantiallythe same time.

The processing system 100 overcomes mechanical speed constraints of therobotic arm 200 which limit overall testing throughput by the inclusionof multiple robotic arms 200 servicing the test slots 310. Each roboticarm 200 may be assigned a work zone 250 that includes a group of testslots 310 across one or more racks 300 for servicing by that robotic arm200. Each robotic arm 200 may service a partial number of the overallnumber of test slots 310 that correspond to its assign work zone 250.The work zone 250 assigned to each robotic arm 200 may encompass onlytest slots 310 that receive certain types of storage devices 500 and/orto certain types of testing. In some examples, the work zone 250includes test slots only within a certain area on the rack(s) 300 (e.g.,directly adjacent the robotic arm 200, upper or lower regions of therack 300, or optimized groupings of test slots 310 determined by thecontroller 400). The processing system 100 may be configured such thatthe work zones 250 designate preferred, rather than exclusive, testslots 310 for servicing by respective robotic arms 200. In someinstances, the multiple work zones 250 overlap with each other, so thatif one automated transporter 200 fails, adjacent robotic arms 200 canservice the test slots 310 of the work zone 250 associated with thefailed robotic arm 200. In the example shown, the first robotic arm 200Aservices a first work zone 250A and the second robotic arm 200B servicesa second works on 250B. Each work zone 250, 250A, 250B may be defined bythe operating envelope 220 of the associated robotic arm 200, 200A, 200B(e.g., all of the test slots 310 accessible by the manipulator 210 ofthe associated robotic arm 200, 200A, 200B).

In implementations that employ storage device transporters 550 formanipulating storage devices 500, as shown in FIG. 4, the robotic arm200 is configured to remove a storage device transporter 550 from one ofthe test slots 310 with the manipulator 210, then pick up a storagedevice 500 from one the totes 700 presented at the transfer station 600or other presentation system (e.g., conveyor, loading/unloading station,etc.) with the storage device transporter 550, and then return thestorage device transporter 550, with a storage device 500 therein, tothe test slot 310 for testing of the storage device 500. After testing,the robotic arm 200 retrieves the tested storage device 500 from thetest slot 310, by removing the storage device transporter 550 carryingthe tested storage device 500 from the test slot 310 (i.e., with themanipulator 210), carrying the tested storage device 500 in the storagedevice transporter 550 to the transfer station 600, and manipulating thestorage device transporter 550 to return the tested storage device 500to one of the totes 700 at the transfer station 600 or other system(e.g., conveyor, loading/unloading station, etc.).

In the examples illustrated in FIGS. 6A-7, each test slot 310 isconfigured to receive the storage device transporter 550. The storagedevice transporter 550 is configured to receive the storage device 500and be handled by the manipulator 210 of the robotic arm 200. In use,one of the storage device transporters 550 is removed from or deliveredto one of the test slots 310 by the robotic arm 200. Each test slot 310includes a test slot housing 320 received by the rack 300 and havingfirst and second portions 322, 324. The first portion 322 of the testslot housing 320 defines a device opening 325 sized to receive a storagedevice 500 and/or a storage device transporter 550 carrying the storagedevice 500 as well as a first air opening 326 (i.e., air entrance). Thesecond portion 324 of the test slot housing 320 defines a second airopening 328 (i.e., air exit) and houses electronics 350.

As illustrated in FIGS. 8-11, the storage device transporter 550includes a transporter body 800 having first and second portions 802,804. The first portion 802 of the transporter body 800 includes amanipulation feature 810 (e.g., indention, protrusion, etc.) configuredto receive or otherwise be engaged by the manipulator 210 fortransporting. The second portion 804 of the transporter body 800 isconfigured to receive a storage device 500. In some examples, the secondtransporter body portion 804 defines a substantially U-shaped opening820 formed by first and second sidewalls 822, 824 and a base plate 826of the transporter body 800. The storage device 500 is received in theU-shaped opening 820 and supported by at least the base plate 826. FIG.11 illustrates an exemplary storage device 500 that includes a housing510 having top, bottom, front, rear, left and right surfaces 512, 514,516, 518, 520, 522. The storage device 500 is typically received withits rear surface 518 substantially facing the first portion 802 of thestorage device transporter body 800. The first portion 802 of thetransporter body 800 includes an air director 830 that receives anddirects air substantially simultaneously (e.g., in parallel) over atleast the top and bottom surfaces 512, 514 of the storage device 500received in the storage device transporter 550. The air director 830defines an air cavity 831 having an air entrance 832 and first andsecond air exits 834, 835. The air director 830 directs air receivedthrough its air entrance 832 out of the first and second air exits 834,835. The first air exit 834 directs air over the top surface 512 of thereceived storage device 500 and the second air exit 835 directs air overthe bottom surface 514 of the received storage device 500.

In some implementations, the air director 830 includes a plenum 836disposed in the cavity 831 for directing at least a portion of the airreceived through the air entrance 832 out through the first air exit 834and over at least the bottom surface 514 of the received storage device500. In some implementations, the air director 830 is weighted tostabilize the storage device transporter 550 against vibration. Forexample, the plenum 836 can be weighted or fabricated of a materialhaving a suitable weight. Air entering into the air cavity 831 can alsoflow over a partition 838 (above which is the second air exit 835) toflow over at least the top surface 512 of the storage device 500. Withthe storage device 500 received within the transporter body 800, thestorage device transporter 550 and the storage device 500 together canbe moved by the automated transporter 200 for placement within one ofthe test slots 310.

Some storage devices 500 can be sensitive to vibrations. Fittingmultiple storage devices 500 in a single test rack 310 and running thestorage devices 500 (e.g., during testing), as well as the insertion andremoval of the storage device transporters 550, each optionally carryinga storage device 500, from the various test slots 310 in the test rack300 can be sources of undesirable vibration. In some cases, for example,one of the storage devices 500 may be operating under test within one ofthe test slots 310, while others are being removed and inserted intoadjacent test slots 310 in the same rack 300. Clamping the storagedevice transporter 550 to the test slot 310 after the storage devicetransporter 550 is fully inserted into the test slot 310 can help toreduce or limit vibrations by limiting the contact and scraping betweenthe storage device transporters 550 and the test slots 310 duringinsertion and removal of the storage device transporters 550.

In some implementations, the manipulator 210 is configured to initiateactuation of a clamping mechanism 840 disposed in the storage devicetransporter 550. This allows actuation of the clamping mechanism 840before the storage device transporter 550 is moved to and from the testslot 310 to inhibit movement of the storage device 500 relative to thestorage device transporter 550 during the move. Prior to insertion inthe test slot 310, the manipulator 210 can again actuate the clampingmechanism 840 to release the storage device 500 within the transporterbody 800. This allows for insertion of the storage device transporter550 into one of the test slots 310, until the storage device 500 is in atest position engaged with the test slot 310 (e.g., a storage deviceconnector 532 of the storage device 500 (FIG. 11) is engaged with a testslot connector 352 (FIG. 12) of the test slot 310). The clampingmechanism 840 may also be configured to engage the test slot 310, oncereceived therein, to inhibit movement of the storage device transporter550 relative to the test slot 310. In such implementations, once thestorage device 500 is in the test position, the clamping mechanism 840is engaged again (e.g., by the manipulator 210) to inhibit movement ofthe storage device transporter 550 relative to the test slot 310. Theclamping of the storage device transporter 550 in this manner can helpto reduce vibrations during testing. In some examples, after insertion,the storage device transporter 550 and storage device 500 carriedtherein are both clamped or secured in combination or individuallywithin the test slot 310. A detailed description of the storage devicetransporter 550 and other details and features combinable with thosedescribed herein may be found in the following U.S. patent applicationsfiled concurrently herewith, entitled “Conductive Heating”, withattorney docket number: 18523-0097001, inventors: Brian Merrow et al.,and having assigned Ser. No. ______, and entitled “Storage DeviceTemperature Sensing”, with attorney docket number: 18523-0098001,inventors: Brian Merrow et al., and having assigned Ser. No. ______. Theentire contents of these applications are hereby incorporated byreference.

Referring again to FIGS. 6A-7 as well as FIG. 12, the rack 300 includesa test slot cooling system 900 disposed adjacent to each test slot 310.The test slot cooling system 900 includes a housing 910 having first andsecond air openings 912, 914 (i.e., air exit and air entrance). Thehousing 910 receives air from the test slot 310 through the second airopening 914 and directs the air through an air cooler 920 to an airmover 930 (e.g., blower, fan, etc.). In the example shown in FIG. 13,the air cooler 920 includes an air cooler body 922 having one or morefins or plates 924 disposed thereon. The air cooler 920 is coupled orattached to a cooling tube 926 through which a chilled liquid (e.g.,water) flows. The chilled cooling tube 926 conducts heat from the aircooler 920 which receives heat through convection from air flowing overthe fins 924. The air mover 930 moves the air through the first airopening 912 back into the test slot 310 through its first air opening326. The first air opening 326 of the test slot housing 320 issubstantially aligned with the first air opening 912 of the test slotcooling system housing 900, and the second air opening 328 of the testslot housing 320 is substantially aligned with the second air opening914 of the test slot cooling system housing 900. In examples using thestorage device transporter 550, the first air opening 326 of the testslot housing 320 is substantially aligned with the air entrance 832 ofthe transporter body 800 for delivering temperature controlled air overa storage device 500 carried by the storage device transporter 550.

FIG. 14 illustrates an exemplary air mover 930 which has an air entrance932 that receives air along a first direction 934 and an air exit 936that delivers air along a second direction 938 substantiallyperpendicular to the first direction. Changing the direction of airmovement within the air mover 930 eliminates the efficiency loss ofchanging the air flow direction within a conduit, thereby increasing thecooling efficiency of the test slot cooling system 900. In someimplementations, the air mover 930 includes an impeller 935 rotating atabout 7100 revolutions per minute (rpm) to produce an air flow rate ofup to about 0.122 m³/min (4.308 CFM) (at zero static pressure) and anair pressure of up to about 20.88 mmH₂O (0.822 inchH₂O) (at zero airflow). In some instances, the air mover 930 is largest component of thetest slot cooling system 900 and therefore dictates the size of the testslot cooling system 900. In some implementations, the air mover 930 haslength L of about 45 mm, a width W of about 45 mm, and a height H ofabout 10 mm, such as DC Blower BFB04512HHA-8A60 provided by DeltaElectronics, Inc., Taoyuan Plant, 252 Shang Ying Road, Kuei SanIndustrial Zone, Yaoyuan Shien, Taiwan R.O.C. The substantiallyhorizontal placement of the air mover 930 within the test slot coolingsystem 900 allows for a relatively lower overall height of the test slotcooling system 900, and therefore a relatively lower overall height ofan associated test slot 310 (allowing greater test slot density in therack 300). The ability of the air mover 930 to redirect the air flowpath 925 (FIG. 15) reduces air resistance in the air flow path 925,thereby lowering the power consumption of the air mover 930 to maintaina threshold air flow rate.

FIG. 15 provides a top view of the rack 300 and illustrates the air flowpath 950 through the test slot cooling system 900 and the test slot 310.FIG. 16 provides a side sectional view of the test slot 310 and the airflow path 950 over the top and bottom surfaces 512, 514 of the receivedstorage device 500. The air may also flow over other surfaces of thestorage device 500 (e.g., front, back, left and right sides 516, 518,520, 522). The air mover 930 delivers air through the first air opening912 (i.e., air entrance) of the test slot cooling system housing 900 andthe first air opening 326 (i.e., air entrance) of the test slot housing320 into the air director 830 of the storage device transporter body800. The air flows through the air entrance 832 of the air director 830in to the air cavity 831. The air flows out of the first air exit 834 ofthe air director 830 (e.g., as directed by the plenum 836) and over atleast the bottom surface 514 of the storage device 500. The air alsoflows through the second air exit 835 (e.g., over the partition 838) andover at least the top surface 512 of the storage device 500. The airmoves from the first portion 322 of the test slot housing 320 to thesecond portion 324 of the test slot housing 320. The air may move overthe electronics 350 in the second portion 324 of the test slot housing320. The air exits the test slot housing 320 through its second airopening 328 (i.e., air exit) into the second air opening 914 (i.e., airentrance) of the test slot cooling system housing 900. The air travelsover the air cooler 920 (e.g., over the air cooler fins 924) which isdisposed in or adjacent to the air flow path 925 and then back into theair entrance 932 of the air mover 930.

In the examples shown, the storage device transporter 550 providesclosure of the device opening 325 of the test slot housing 320 oncereceived therein. The air director 830 of the storage device transporter550 as well as the air mover 930 are situated near the inlet of thedevice opening 325 of the test slot housing 320. As the air mover 930moves the air to circulate along the air path 950, the air moves fromthe first portion 322 of the test slot housing 320 along a commondirection to the second portion 324 of the test slot housing 320 whiletraversing the entire length of the received storage device 500. Sincethe air moves substantially concurrently along at least the top andbottom surfaces 512, 514 of the storage device 500, the air providessubstantially even cooling of the storage device 500. If the air wasrouted along once side of the storage device first, such as the topsurface 512, and then directed along another side sequentially second,such as the bottom surface 514, the air would become preheated afterpassing over the first side of the storage device 500 before passingover any additional sides of the storage device, thereby providingrelatively less efficient cooling than flowing air over two or moresides of the storage device 500 substantially concurrently and/orwithout recirculation over the storage device 500 before passing throughthe air cooler 920.

A method of performing storage device testing includes presenting one ormore storage devices 500 to a storage device testing system 100 fortesting at a source location (e.g., a loading/unloading station 600,storage device tote 700, test slot(s) 310, etc.) and actuating anautomated transporter 200 (e.g. robotic arm) to retrieve one or morestorage devices 500 from the source location and deliver the retrievedstorage device(s) 500 to corresponding test slots 310 disposed on a rack300 of the storage device testing system 100. The method includesactuating the automated transporter 200 to insert each retrieved storagedevice 500 in its respective test slot 310, and performing a test (e.g.,functionality, power, connectivity, etc.) on the storage devices 500received by the test slot 310. The method may also include actuating theautomated transporter 200 to retrieve the tested storage device(s) 500from the test slot(s) 310 and deliver the tested storage device(s) 500to a destination location (e.g., another test slot 310, a storage devicetote 700, a loading/unloading station 600, etc).

A method of regulating the temperature of a storage device 500 receivedin a storage device testing system 100 includes delivering a flow of airinto an air entrance 326 of a test slot housing 320 and directing theair flow substantially simultaneously over at least the top and bottomsurfaces 512, 514 of the storage device 500. The method may includedelivering the air flow to an air director 830 that directs the air flowover at least the top and bottom surfaces 512, 514 of the storage device500. In some implementations, the method includes supporting the storagedevice 500 in a storage device transporter 550 received in the test slothousing 320. The storage device transporter 550 includes a body 800having first and second portions 802, 804. The first storage devicetransporter body portion 802 includes the air director 830 and thesecond storage device transporter body portion 804 is configured toreceive the storage device 500. The storage device 500 has top, bottom,front, rear, right, and left side surfaces 512, 514, 516, 518, 520, 522and is received with its rear surface 518 substantially facing the firstbody portion 802 of the storage device transporter body 800. The methodmay include weighting the air director 830, in some examples the plenum836) to reduce movement of the storage device transporter while receivedby the storage device testing system.

In some implementations, the method includes delivering the air flowinto an air entrance 832 of the air director 830. The air director 830directs the air received through the air entrance 832 out first andsecond air exits 834, 835 of the air director 830. The first air exit834 directs air over at least the bottom surface 514 of the receivedstorage device 500 and the second air exit 835 directs air over at leastthe top surface 512 of the received storage device 500. The air director830 may define a cavity 831 in pneumatic communication with the airentrance 832 and air exits 834, 835 of the air director 830. The airdirector 830 includes a plenum 836 disposed in the cavity 831 fordirecting at least a portion of the air received in the cavity 831 outof the first air exit 834. In some examples, the method includesweighting the plenum 836 to reduce movement of the storage devicetransporter 550 while received by the storage device testing system 100(e.g., while received in the test slot 310).

In some implementations, the method includes directing the flow of airto an air mover 930 in pneumatic communication with the air entrance 326of the test slot housing 320. The air mover 930 delivers the flow of airinto the air entrance 326 of a test slot housing 320 with the air flowmoving along a closed loop path 950 (FIG. 15). The method may includereceiving the flow of air into the air mover 930 along a first direction934and delivering the air flow to the air entrance 326 of the test slothousing 320 along a second direction 938 substantially perpendicular tothe first direction 934. The method includes directing the flow of airover an air cooler 920 disposed in the air flow path 950 upstream of theair mover 930. In some examples, the method includes delivering the airflow into the air entrance 326 of the test slot housing 320 (e.g., viathe air mover 930) at an air flow rate of up to about 0.122 m3/min(4.308 CFM) and an air pressure of up to about 20.88 mmH2O (0.822inchH2O).

A number of implementations have been described. Nevertheless, it willbe understood that various modifications may be made without departingfrom the spirit and scope of the disclosure. Accordingly, otherimplementations are within the scope of the following claims.

1-3. (canceled)
 4. A test slot cooling system for a storage devicetesting system, the test slot cooling system comprising: a storagedevice transporter comprising first and second portions, the firstportion of the storage device transporter comprising an air director,the second portion of the storage device transporter configured toreceive a storage device; a test slot housing defining an air entranceand a transporter opening for receiving the storage device transporter,the air entrance in pneumatic communication with the air director of thestorage device transporter received in the test slot housing; an airmover in pneumatic communication with the air entrance of the test slothousing for delivering air to the air director; wherein the air directoris configured to direct air substantially simultaneously over at leasttop and bottom surfaces of the storage device received in the storagedevice transporter, and wherein the plenum comprises a weight weightedconfigured to reduce movement of the storage device transporter in thetest slot housing. 5-8. (canceled)
 9. The test slot cooling system ofclaim 4, wherein the air mover comprises an air mover body having awidth of about 45 mm, a length of about 45 mm, and a height of about 10mm.
 10. The test slot cooling system of claim 4, wherein the air moveris configured to produce an air flow rate of up to about 0.122 m³/min(4.308 CFM) and an air pressure of up to about 20.88 mmH₂O (0.822inchH₂O). 11-12. (canceled)
 13. A test slot cooling system for a storagedevice testing system, the test slot cooling system comprising: a testslot housing defining an air entrance and a device opening configured toreceive a storage device; an air mover in pneumatic communication withthe air entrance of the test slot housing, the air mover configured todeliver air to the storage device received in the test slot housing;wherein the air mover comprises an air entrance and an air exit, the airexit in pneumatic communication with the air entrance of the test slothousing, the air mover configured to receive air along a first directionthrough the air entrance and configured to deliver air out of the airexit along a second direction substantially perpendicular to the firstdirection.
 14. The test slot cooling system of claim 13, furthercomprising: a cooling system housing comprising: an air entrance inpneumatic communication with an air exit of the test slot housing; andan air exit in pneumatic communication with the air entrance of the testslot housing, wherein the air mover is configured to circulate airreceived through air entrance of the cooling system housing out of theair exit of the cooling system housing, along a closed loop path throughthe test slot housing and the cooling system housing.
 15. The test slotcooling system of claim 13, wherein the air mover comprises an air moverbody having a width of about 45 mm, a length of about 45 mm, and aheight of about 10 mm.
 16. The test slot cooling system of claim 13,wherein the air mover is configured to produce an air flow rate of up toabout 0.122 m³/min (4.308 CFM) and an air pressure of up to about 20.88mmH₂O (0.822 inchH₂O).
 17. The test slot cooling system of claim 13,further comprising: an air cooler in pneumatic communication with theair mover, wherein the air cooler comprises an air cooler body and atleast one fin disposed on the air cooler body, the at least one finconfigured to cool air passing thereover.
 18. A storage devicetransporter for a storage device testing system, the storage devicetransporter comprising: a body comprising first and second portions, thefirst portion comprising an air director, the body portion configured toreceive a storage device comprising top, bottom, front, rear, right, andleft side surfaces, the storage device being received with the rearsurface of the storage device substantially facing the first portion ofthe body; wherein the air director is configured to an air flow and isconfigured to direct the air flow substantially simultaneously over atleast the top and bottom surfaces of the storage device received in thestorage device transporter.
 19. The storage device transporter of claim18, wherein: the air director comprises an air entrance and first andsecond air exits, the air director is configured to direct air receivedthrough the air entrance out the first and second air exits, the firstair exit is configured to direct air over at least the bottom surface ofthe storage device received in the storage device transporter, and thesecond air exit is configured to direct air over at least the topsurface of the storage device received in the storage devicetransporter.
 20. The storage device transporter of claim 18, wherein:the air director defines a cavity in pneumatic communication with theair entrance and air exits, the air director comprising a plenumdisposed in the cavity, and the plenum is configured to direct at leasta portion of air received in the cavity out of the first air exit. 21.The storage device transporter of claim 20, wherein the plenum comprisesa weight weighted configured to reduce movement of the storage devicetransporter while received by the storage device testing system. 22.(canceled)
 23. A method of regulating the temperature of a storagedevice received in a storage device testing system, the methodcomprising: delivering an air flow into an air entrance of a test slothousing; and directing the air flow substantially simultaneously over atleast top and bottom surfaces of the storage device.
 24. The method ofclaim 23, further comprising delivering the air flow to an air directorthat is configured to direct the air flow over at least the top andbottom surfaces of the storage device.
 25. The method of claim 24,further comprising supporting the storage device in a storage devicetransporter received in the test slot housing, the storage devicetransporter comprising first and second portions, the first portioncomprising the air director, the second portion configured to receivethe storage device, the storage device comprising top, bottom, front,rear, right, and left side surfaces and configured to be received withthe rear surface of the storage device substantially facing the firstportion.
 26. The method of claim 25, further comprising weighting theair director to reduce movement of the storage device transporter whilereceived by the storage device testing system.
 27. The method of claim24, further comprising: delivering the air flow into an air entrance ofthe air director, wherein the air director is configured to direct airreceived through the air entrance out first and second air exits of theair director, the first air exit is configured to direct air over atleast the bottom surface of the storage device received in a storagedevice testing system, and the second air exit is configured to directover at least the top surface of the storage device received in astorage device testing system.
 28. The method of claim 27, wherein: theair director defines a cavity in pneumatic communication with the airentrance and air exits of the air director, the air director comprises aplenum disposed in the cavity, and the plenum is configured to directdirecting at least a portion of air received in the cavity out of thefirst air exit.
 29. The method of claim 23, further comprising weightingthe plenum to reduce movement of the storage device transporter whilereceived by the storage device testing system.
 30. The method of claim23, further comprising: directing the air flow to an air mover inpneumatic communication with the air entrance of a test slot housing,wherein the air mover is configured to deliver the air flow into the airentrance of a test slot housing, the air flow moving along a closed looppath.
 31. The method of claim 30, further comprising receiving the airflow into the air mover along a first direction and delivering the airflow to the air entrance of the test slot housing along a seconddirection substantially perpendicular to the first direction.
 32. Themethod of claim 30, further comprising directing the air flow over anair cooler disposed in an air flow path upstream of the air mover. 33.The method of claim 23, further comprising delivering the air flow intothe air entrance of the test slot housing at an air flow rate of up toabout 0.122 m³/min (4.308 CFM) and an air pressure of up to about 20.88mmH₂O (0.822 inchH₂O).